NDLI: Reliability study of the nih2 strain gage

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Reliability study of the nih2 strain gage

Content Provider	NASA Technical Reports Server (NTRS)
Author	Klein, Glenn C. Rash Jr., Donald E.
Copyright Year	1993
Description	This paper summarizes a joint study by Gates Aerospace Batteries (GAB) and the Reliability Analysis Center (RAC). This study characterizes the reliability and robustness of the temperature compensated strain gages currently specified for sensing of internal pressure of NiH2 cells. These strain gages are characterized as fully encapsulated, metallic foil grids with known resistance that varies with deformation. The measurable deformation, when typically installed on the hemispherical portion of a NiH2 cell, is proportional to the material stresses as generated by internal cell pressures. The internal pressure sensed in this manner is calibrated to indicate the state-of-charge for the cell. This study analyzes and assesses both robustness and reliability for the basic design of the strain gage, the installation of the strain gage, and the circuitry involved.
File Size	584759
Page Count	16
File Format	PDF
Alternate Webpage(s)	http://archive.org/details/NASA_NTRS_Archive_19930011326
Archival Resource Key	ark:/13960/t1pg6kx2g
Language	English
Publisher Date	1993-02-01
Access Restriction	Open
Subject Keyword	Nickel Hydrogen Batteries Robustness Mathematics Deformation Electric Charge Pressure Vessels Calibrating Reliability Analysis Strain Gages Metal Foils Pressure Measurement Internal Pressure Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text
Resource Type	Article

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