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Contamination analyses of technology mirror assembly optical surfaces
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Germani, Mark S. |
| Copyright Year | 1991 |
| Description | Automated electron microprobe analyses were performed on tape lift samples from the Technology Mirror Assembly (TMA) optical surfaces. Details of the analyses are given, and the contamination of the mirror surfaces is discussed. Based on the automated analyses of the tape lifts from the TMA surfaces and the control blank, we can conclude that the particles identified on the actual samples were not a result of contamination due to the handling or sampling process itself and that the particles reflect the actual contamination on the surface of the mirror. |
| File Size | 645128 |
| Page Count | 20 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19920014960 |
| Archival Resource Key | ark:/13960/t5hb41q2k |
| Language | English |
| Publisher Date | 1991-09-30 |
| Access Restriction | Open |
| Subject Keyword | Optics Spacecraft Instruments Optical Properties Sampling X Ray Astrophysics Facility Mirrors Electron Probes Particles Contamination Space Stations X Ray Telescopes Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
