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Ground and space based optical analysis of materials degradation in low-earth-orbit
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | De, Bhola N. Synowicki, Ron Woollam, John A. Peterkin, Jane Machlab, Hassanayn Johs, Blaine Hale, Jeffrey S. |
| Copyright Year | 1991 |
| Description | There is strong interest in being able to accurately and sensitively monitor materials degradation in both ground-based and space-based environments. Two optical techniques for sensitive degradation monitoring are reviewed: spectroscopic ellipsometry and photothermal spectroscopy. These techniques complement each other in that ellipsometry is sensitive to atomically thin surface and subsurface changes, and photothermal spectroscopy is sensitive to local defects, pin-holes, subsurface defects, and delamination. Progress in applying these spectroscopies (both ex situ and in situ) to atomic oxygen degradation of space materials is reviewed. |
| File Size | 300131 |
| Page Count | 6 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19910011424 |
| Archival Resource Key | ark:/13960/t9m37qt9b |
| Language | English |
| Publisher Date | 1991-01-01 |
| Access Restriction | Open |
| Subject Keyword | Inorganic And Physical Chemistry Spectroscopy Earth Orbital Environments Nondestructive Tests Structural Failure Spacecraft Construction Materials Photothermal Conversion Ellipsometry Degradation Oxygen Atoms Low Earth Orbits Materials Tests Failure Analysis Delaminating Monitors Oxidation Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
