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Multiwavelength pyrometry to correct for reflected radiation
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Ng, Daniel L. P. |
| Copyright Year | 1990 |
| Description | Computer curve fitting is used in multiwavelength pyrometry to measure the temperature of a surface in the presence of reflected radiation by decomposing its radiation spectrum. Computer-simulated spectra (at a surface temperature of 1000 K; in the wavelength region 0.3 to 20 microns; with a reflected radiation-source temperature of 700 to 2500 K; and reflector emissivity from 0.1 to 0.9) were generated and decomposed. This method of pyrometry determined the surface temperatures under these conditions to within 5 percent. The practicability of the method was further demonstrated by the successful analysis of a related problem--decomposition of the real spectrum of an infrared source containing two emitters to determine their temperatures. |
| File Size | 655416 |
| Page Count | 14 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19900014398 |
| Archival Resource Key | ark:/13960/t83j8cd88 |
| Language | English |
| Publisher Date | 1990-06-01 |
| Access Restriction | Open |
| Subject Keyword | Temperature Distribution Surface Temperature Decomposition Computerized Simulation Spectra Temperature Measurement Reflectors Emissivity Radiation Sources Reflected Waves Infrared Radiation Pyrometers Curve Fitting Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
