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Transmission and reflection studies of thin films in the vacuum ultraviolet
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Peterson, Lennart R. |
| Copyright Year | 1989 |
| Description | Both the transmittance and reflectance of 2 mm thick MgF2 substrates and of thin films of BaF2, CaF2, LaF3, MgF2, Al2O3, HfO2, and SiO2 deposited on these substrates were measured for the wavelength range 120 nm to 230 nm. Results for BaF2, LaF2 and MgF2 show promise as being good materials from which interference filters can be made. The software and related hardware needed to take large amounts of data automatically in future measurements of the transmittance and reflectance was developed. |
| File Size | 361346 |
| Page Count | 14 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19900010096 |
| Archival Resource Key | ark:/13960/t3130s83h |
| Language | English |
| Publisher Date | 1989-12-01 |
| Access Restriction | Open |
| Subject Keyword | Optics Thin Films Radiation Effects Far Ultraviolet Radiation Calibrating Bandpass Filters Magnesium Fluorides Transmittance Substrates Aluminum Oxides Silicon Dioxide Reflectance Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |