NDLI: An auger electron spectroscopy study of surface-preparation contaminants

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An auger electron spectroscopy study of surface-preparation contaminants

Content Provider	NASA Technical Reports Server (NTRS)
Author	Outlaw, R. A. Wu, D. Stephens, R. M. Hopson, P.
Copyright Year	1990
Description	There are many cleaning techniques that are presently being employed for surface preparation of materials that are subsequently exposed to ultrahigh vacuum (UHV). Unfortunately, there are virtually no comparative measurements which establish the residual contaminant level of each method. In this report, eleven different cleaning methods, ranging from only detergent cleaning to electrochemical polishing, were applied to identical samples of 347 stainless steel. Two surface conditions, a standard machined surface and a mechanically polished surface, were studied. Auger electron spectroscopy (AES) within a UHV environment was then used to detect the types of contaminants and the magnitudes found on the sample surfaces. It was found that the electrochemical polishing gave the least contaminated surface of all metals studied and that mechanically polished surfaces were significantly cleaner than the as-machined surfaces for any given cleaning method. Furthermore, it was also found that the residual contaminations left by methanol, ethanol, isopropyl alcohol, acetone, and freon finishing rinses are almost the same.
File Size	855886
Page Count	22
File Format	PDF
Alternate Webpage(s)	http://archive.org/details/NASA_NTRS_Archive_19900007652
Archival Resource Key	ark:/13960/t3rv5g02q
Language	English
Publisher Date	1990-02-01
Access Restriction	Open
Subject Keyword	Solid Surfaces Contaminants Electropolishing Auger Spectroscopy Electrochemical Machining Spectroscopic Analysis Electron Spectroscopy Cleaning Ultrahigh Vacuum Surface Finishing Stainless Steels Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text
Resource Type	Technical Report

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