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Nuclear fragmentation studies for microelectronic application
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Wilson, John W. Ngo, Duc M. Fogarty, Thomas N. Buck, Warren W. |
| Copyright Year | 1989 |
| Description | A formalism for target fragment transport is presented with application to energy loss spectra in thin silicon devices. Predicted results are compared to experiments with the surface barrier detectors of McNulty et al. The intranuclear cascade nuclear reaction model does not predict the McNulty experimental data for the highest energy events. A semiempirical nuclear cross section gives an adequate explanation of McNulty's experiments. Application of the formalism to specific electronic devices is discussed. |
| File Size | 3610289 |
| Page Count | 23 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19890020783 |
| Archival Resource Key | ark:/13960/t0cv9dj1v |
| Language | English |
| Publisher Date | 1989-01-01 |
| Access Restriction | Open |
| Subject Keyword | Space Radiation Energy Dissipation Energy Spectra Collision Parameters Microelectronics Energy Transfer Formalism Data Bases Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
