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Quantitative void characterization in structural ceramics using scanning laser acoustic microscopy
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Baaklini, G. Y. Roth, D. J. Generazio, E. R. |
| Copyright Year | 1986 |
| Description | The ability of scanning laser acoustic microscopy (SLAM) to characterize artificially seeded voids in sintered silicon nitride structural ceramic specimens was investigated. Using trigonometric relationships and Airy's diffraction theory, predictions of internal void depth and size were obtained from acoustic diffraction patterns produced by the voids. Agreement was observed between actual and predicted void depths. However, predicted void diameters were generally much greater than actual diameters. Precise diameter predictions are difficult to obtain due to measurement uncertainty and the limitations of 100 MHz SLAM applied to typical ceramic specimens. |
| File Size | 30987710 |
| Page Count | 24 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19860022441 |
| Archival Resource Key | ark:/13960/t01z9349j |
| Language | English |
| Publisher Date | 1986-01-01 |
| Access Restriction | Open |
| Subject Keyword | Diffraction Patterns Voids Nondestructive Tests Wave Diffraction Depth Measurement Acoustic Microscopes Silicon Nitrides Size Determination Ceramics Ultrasonic Flaw Detection Laser Microscopy Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
