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Thermal stress cycling of gaas solar cells (Document No: 19860008395)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Wendt, J. P. Janousek, B. K. Francis, R. W. |
| Copyright Year | 1985 |
| Description | A thermal cycling experiment was performed on GaAs solar cells to establish the electrical and structural integrity of these cells under the temperature conditions of a simulated low-Earth orbit of 3-year duration. Thirty single junction GaAs cells were obtained and tests were performed to establish the beginning-of-life characteristics of these cells. The tests consisted of cell I-V power output curves, from which were obtained short-circuit current, open circuit voltage, fill factor, and cell efficiency, and optical micrographs, spectral response, and ion microprobe mass analysis (IMMA) depth profiles on both the front surfaces and the front metallic contacts of the cells. Following 5,000 thermal cycles, the performance of the cells was reexamined in addition to any factors which might contribute to performance degradation. It is established that, after 5,000 thermal cycles, the cells retain their power output with no loss of structural integrity or change in physical appearance. |
| File Size | 283342 |
| Page Count | 8 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19860008395 |
| Archival Resource Key | ark:/13960/t3xt0ks32 |
| Language | English |
| Publisher Date | 1985-01-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Cells Earth Orbital Environments Gallium Arsenides Performance Tests Low Earth Orbits Temperature Effects Thermal Cycling Tests Thermodynamic Properties Thermal Stresses Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
