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Fractured toughness of si3n4 measured with short bar chevron-notched specimens
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Shannon Jr., J. L. Salem, J. A. |
| Copyright Year | 1985 |
| Description | The short bar chevron-notched specimen is used to measure the plane strain fracture toughness of hot pressed Si3N4. Specimen proportions and chevron-notch angle are varied, thereby varying the amount of crack extension to maximum load (upon which K sub IC is based). The measured toughness (4.68 + or - 0.19 MNm to the 3/2 power) is independent of these variations, inferring that the material has a flat crack growth resistance curve. |
| File Size | 1517842 |
| Page Count | 20 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19860004027 |
| Archival Resource Key | ark:/13960/t5p895b5h |
| Language | English |
| Publisher Date | 1985-01-01 |
| Access Restriction | Open |
| Subject Keyword | Nonmetallic Materials Hot Pressing Notch Sensitivity Fracture Mechanics Notch Strength Fatigue Materials Plane Strain Silicon Nitrides Notch Tests Fracture Strength Loads Forces Crack Propagation Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |