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Silicon sheet surface studies (Document No: 19850024128)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Danyluk, S. |
| Copyright Year | 1984 |
| Description | Several activities were performed in the area of silicon sheet surface studies. An interferometry technique was developed for measuring residual stresses in short, thin silicon sheets. Simulation of abrasion of silicon by diamond and by scrating and indentation tests was carried out. The wear rate in silicon was correlated with a wear model. |
| File Size | 566725 |
| Page Count | 10 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19850024128 |
| Archival Resource Key | ark:/13960/t0vq7s60n |
| Language | English |
| Publisher Date | 1984-10-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Crystal Growth Nondestructive Tests Membranes Wear Silicon Residual Stress Crystal Structure Interferometry Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
