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Investigation of accelerated stress factors and failure/degradation mechanisms in terrestrial solar cells (Document No: 19850011214)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Lathrop, J. W. |
| Copyright Year | 1984 |
| Description | Research on the reliability of terrestrial solar cells was performed to identify failure/degradation modes affecting solar cells and to relate these to basic physical, chemical, and metallurgical phenomena. Particular concerns addressed were the reliability attributes of individual single crystalline, polycrystalline, and amorphous thin film silicon cells. Results of subjecting different types of crystalline cells to the Clemson accelerated test schedule are given. Preliminary step stress results on one type of thin film amorphous silicon (a:Si) cell indicated that extraneous degradation modes were introduced above 140 C. Also described is development of measurement procedures which are applicable to the reliability testing of a:Si solar cells as well as an approach to achieving the necessary repeatability of fabricating a simulated a:Si reference cell from crystalline silicon photodiodes. |
| File Size | 14813904 |
| Page Count | 81 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19850011214 |
| Archival Resource Key | ark:/13960/t7jq5t87q |
| Language | English |
| Publisher Date | 1984-09-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Thin Films Solar Cells Degradation Stresses Electrical Measurement Component Reliability Accelerated Life Tests Photovoltaic Cells Electrical Properties Polycrystals Amorphous Materials Failure Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
