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The axaf technology program: the optical flats tests
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Harper, J. D. Reily, J. C. Wyman, C. L. Williams, A. C. Zombeck, M. Weisskopf, M. C. |
| Copyright Year | 1984 |
| Description | The results of a technology program aimed at determining the limits of surface polishing for reflecting X-ray telescopes is presented. This program is part of the major task of developing the Advanced X-ray Astrophysical Facility (AXAF). By studying the optical properties of state-of-the-art polished flat surfaces, conclusions were drawn as to the potential capability of AXAF. Surface microtopography of the flats as well as their figure are studied by X-ray, visual, and mechanical techniques. These techniques and their results are described. The employed polishing techniques are more than adequate for the specifications of the AXAF mirrors. |
| File Size | 4001449 |
| Page Count | 97 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19840012273 |
| Archival Resource Key | ark:/13960/t6m08z76p |
| Language | English |
| Publisher Date | 1984-01-01 |
| Access Restriction | Open |
| Subject Keyword | Optics Nickel Coatings Microanalysis Fourier Analysis Polishing Gold Coatings Surface Roughness X Ray Analysis Surface Finishing X Ray Diffraction X Ray Telescopes Reflecting Telescopes Metal Coatings Scatterometers Optical Measurement Platinum Compounds Diffractometers Optical Properties Profilometers X Ray Scattering X Ray Astrophysics Facility Mirrors Reflectance Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |