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Stress studies in efg (Document No: 19830014474)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1983 |
| Description | A computer code which can account for plastic deformation effects on stress generated in silicon sheet grown at high speeds is fully operative. Stress and strain rate distributions are presented for two different sheet temperature profiles. The calculations show that residual stress levels are very sensitive to details of the cooling profile in a sheet with creep. Experimental work has been started in several areas to improve understanding of ribbon temperature profiles and stress distributions associated with a 10 cm wide ribbon cartridge system. |
| File Size | 2136373 |
| Page Count | 23 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19830014474 |
| Archival Resource Key | ark:/13960/t4wh7dc72 |
| Language | English |
| Publisher Date | 1983-02-15 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Arrays Flat Plates Stress Distribution Silicon Plastic Deformation Temperature Profiles Photovoltaic Conversion Computer Programs Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |