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Application of surface analysis to solve problems of wear
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Buckley, D. H. |
| Copyright Year | 1981 |
| Description | Results are presented for the use of surface analytical tools including field ion microscopy, Auger emission spectroscopy analysis (AES), cylindrical mirror Auger analysis and X-ray photoelectron spectroscopy (XPS). Data from the field ion microscope reveal adhesive transfer (wear) at the atomic level with the formation of surface compounds not found in the bulk, and AES reveals that this transfer will occur even in the presence of surface oxides. Both AES and XPS reveal that in abrasive wear with silicon carbide and diamond contacting the transition metals, the surface and the abrasive undergo a chemical or structural change which effects wear. With silicon carbide, silicon volatilizes leaving behind a pseudo-graphitic surface and the surface of diamond is observed to graphitize. |
| File Size | 5565008 |
| Page Count | 34 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19820006646 |
| Archival Resource Key | ark:/13960/t4jm7368h |
| Language | English |
| Publisher Date | 1981-01-01 |
| Access Restriction | Open |
| Subject Keyword | Mechanical Engineering Gold X Ray Spectroscopy Diamonds Auger Spectroscopy Silicon Carbides Adhesion Photoelectron Spectroscopy Solid Surfaces Friction Wear Tungsten Vacuum Apparatus Surface Properties Ion Microscopes Lubrication Sliding Friction Tribology Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
