Loading...
Please wait, while we are loading the content...
Similar Documents
Performance of high resistivity n+pp+ silicon solar cells under 1 mev electron irradiation
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Weinberg, I. Hermann, A. M. Swartz, C. K. Goradia, C. |
| Copyright Year | 1981 |
| Description | High resistivity (1250 and 84 ohm-cm) n(+)pp(+) silicon solar cells were irradiated and their performance evaluated as a function of fluence. The greatest degradation in power occurred for the higher resistivity cell. The data were analyzed under open circuit conditions, and the components of V sub oc determined as a function of fluence. It was found that the voltage contributions from the front and back junctions decreased while the base component (V sub B) increased with fluence. The anomalous behavior of V sub B was attributed to an increase in the base minority carrier gradient with fluence. An argument that the increased power degradation in the 1250 ohm-cm cells was attributable to an increased voltage drop in the base is presented. Diffusion lengths calculated under high injection conditions were significantly greater than those determined under low injection. This was attributed to a saturation of recombination centers under high injection conditions. |
| File Size | 957462 |
| Page Count | 12 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19810015092 |
| Archival Resource Key | ark:/13960/t0rr6nz59 |
| Language | English |
| Publisher Date | 1981-01-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Cells Electron Irradiation Electrical Resistivity Fluence Performance Prediction Radiation Tolerance Carrier Injection Majority Carriers Minority Carriers Diffusion Open Circuit Voltage Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |