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Film thickness for different regimes of fluid-film lubrication
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Hamrock, B. J. |
| Copyright Year | 1980 |
| Description | Film thickness equations are provided for four fluid-film lubrication regimes found in elliptical contacts. These regimes are isoviscous-rigid; viscous-rigid; elastohydrodynamic lubrication of low-elastic-modulus materials (soft EHL), or isoviscous-elastic; and elastohydrodynamic lubrication of high-elastic-modulus materials (hard EHL), or viscous-elastic. The influence or lack of influence of elastic and viscous effects is the factor that distinguishes these regimes. The results are presented as a map of the lubrication regimes, with film thickness contours on a log-log grid of the viscosity and elasticity for three values of the ellipticity parameter. |
| File Size | 608504 |
| Page Count | 14 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19800021234 |
| Archival Resource Key | ark:/13960/t2x39kz17 |
| Language | English |
| Publisher Date | 1980-01-01 |
| Access Restriction | Open |
| Subject Keyword | Mechanical Engineering Ellipticity Viscosity Fluid Films Lubrication Elastic Properties Dimensionless Numbers Film Thickness Elastodynamics Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
