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Study of surge current effects on solid tantalum capacitors
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1980 |
| Description | Results are presented of a 2,000 hour cycled life test program conducted to determine the effect of short term surge current screening on approximately 47 micron f/volt solid tantalum capacitors. The format provides average values and standard deviations of the parameters, capacitance, dissipation factor, and equivalent series resistance at 120 Hz, 1KHz, abd 40 KHz. |
| File Size | 10977692 |
| Page Count | 102 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19800014110 |
| Archival Resource Key | ark:/13960/t41s1mh15 |
| Language | English |
| Publisher Date | 1980-03-20 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Ohmic Dissipation Tables Data Tantalum Capacitors Life Durability Electric Fuses Capacitance Solid State Devices Circuit Protection Surges Overvoltage Electric Equipment Tests Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
