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Quantitative analysis of defects in silicon. silicon sheet growth development for the large area silicon sheet task of the low-cost solar array project
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Natesh, R. Smith, J. M. Qidwai, H. A. |
| Copyright Year | 1979 |
| Description | The various steps involved in the chemical polishing and etching of silicon samples are described. Data on twins, dislocation pits, and grain boundaries from thirty-one (31) silicon sample are also discussed. A brief review of the changes made to upgrade the image analysis system is included. |
| File Size | 7045309 |
| Page Count | 93 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19790018321 |
| Archival Resource Key | ark:/13960/t96738545 |
| Language | English |
| Publisher Date | 1979-01-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Cells Grain Boundaries Tables Data Crystal Defects Crystal Dislocations Polishing Silicon Etching Quantitative Analysis Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
