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Preliminary study of the reliability of imaging charge coupled devices
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Homan, R. A. Johnson, D. L. Young, V. F. Beall, J. R. Borenstein, M. D. Wilson, D. D. |
| Copyright Year | 1978 |
| Description | Imaging CCDs are capable of low light level response and high signal-to-noise ratios. In space applications they offer the user the ability to achieve extremely high resolution imaging with minimum circuitry in the photo sensor array. This work relates the CCD121H Fairchild device to the fundamentals of CCDs and the representative technologies. Several failure modes are described, construction is analyzed and test results are reported. In addition, the relationship of the device reliability to packaging principles is analyzed and test data presented. Finally, a test program is defined for more general reliability evaluation of CCDs. |
| File Size | 62783885 |
| Page Count | 118 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19780021409 |
| Archival Resource Key | ark:/13960/t20c9rm54 |
| Language | English |
| Publisher Date | 1978-06-01 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Charge Coupled Devices Reliability Analysis Electro-optics Circuits Semiconductors Materials Failure Modes Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
