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Real time reflectometer. [measurement of specular reflectance
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1977 |
| Description | A real time reflectometer with the particular utility of measuring fairly rapid (transient) changes in the specular reflectance of a sample which is continuously exposed to a perturbing environment is described. A fixed radiation source, a fixed detector, a uniformly rotating sample wheel, and a uniformly rotating optical wheel protect against misalignment problems. The reflectometer operates by comparing the measurings of a reflected signal with that of a reference signal made within fractions of a second of one another. Reflectance is measured in the infrared, visible, and vacuum ultraviolet regions. |
| File Size | 731427 |
| Page Count | 10 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19770024521 |
| Archival Resource Key | ark:/13960/t81k46g2d |
| Language | English |
| Publisher Date | 1977-08-09 |
| Access Restriction | Open |
| Subject Keyword | Optical Measurement Light Visible Radiation Specular Reflection Optical Properties Ultraviolet Spectra Infrared Spectra Perturbation Reflectometers Real Time Operation Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Patent |