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The growth of deactivated layers on csi(na) scintillating crystals
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Goodman, N. B. |
| Copyright Year | 1975 |
| Description | An effective and sensitive measurement of the depth of a deactivated or dead layer can be obtained from the relative attenuation of the 22.162 KeV and 87.9 KeV X-rays emitted by Cd 109. The alpha-particles emitted by Am 241 are also useful in measuring dead layers less than 25 microns. The properties and temporal development of dead layers are discussed in detail. The rate of growth of a deal layer is closely related to the ambient humidity, and the damage to the crystal is irreversible by any known process. The dead layer can be minimized by polishing all crystal surfaces and by keeping the crystal in a vacuum or a dry atmosphere. Since a dead layer seriously inhibits the response of a crystal to X-rays of energies below approximately 20 keV, CsI(Na) detectors should not be used at these energies unless precautions are taken to ensure that no dead layer forms. |
| File Size | 890241 |
| Page Count | 25 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19750022825 |
| Archival Resource Key | ark:/13960/t4vj09w4g |
| Language | English |
| Publisher Date | 1975-08-01 |
| Access Restriction | Open |
| Subject Keyword | Solid-state Physics Crystal Growth Radiation Effects Scintillation Counters Alpha Particles Cesium Iodides Radiation Damage Sodium Compounds X Ray Sources Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
