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Adhesion and friction behavior of group 4 elements germanium, silicon, tin, and lead
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Buckley, D. H. |
| Copyright Year | 1975 |
| Description | Adhesion and friction studies were conducted with thin films of the group IV elements silicon, germanium, tin, and lead ion plated on the nickel (011) substrate. The mating surface was gold (111). Contacts were made for the elements in the clean state and with oxygen present. Adhesion and friction experiments were conducted at very light loads of 1 to 10 g. Sliding was at a speed of 0.7 mm/min. Friction results indicate that the more covalently bonded elements silicon and germanium exhibit lower adhesion and friction than the more metallic bonded tin and lead. The adhesion of gold to germanium was observed, and recrystallization of the transferred gold occurred. Plastic flow of germanium was seen with sliding. Oxygen reduced, but did not eliminate, the adhesion observed with germanium and silicon. |
| File Size | 2102460 |
| Page Count | 22 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19750010329 |
| Archival Resource Key | ark:/13960/t1rg0hk11 |
| Language | English |
| Publisher Date | 1975-03-01 |
| Access Restriction | Open |
| Subject Keyword | Metallic Materials Gold Friction Tin Auger Spectroscopy Germanium Sliding Silicon Lead Metal Adhesion Nickel Plate Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
