Loading...
Please wait, while we are loading the content...
Similar Documents
Microcircuit testing and fabrication, using scanning electron microscopes
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Nicolas, D. P. |
| Copyright Year | 1975 |
| Description | Scanning electron microscopes are used to determine both user-induced damages and manufacturing defects subtle enough to be missed by conventional light microscopy. Method offers greater depth of field and increased working distances. |
| File Size | 123194 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19750000304 |
| Archival Resource Key | ark:/13960/t3dz5199p |
| Language | English |
| Publisher Date | 1975-12-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Fabrication Nondestructive Tests Scanning Circuits Spectrometers Quality Control Electron Microscopes Solid State Devices Microelectronics Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |