Loading...
Please wait, while we are loading the content...
Similar Documents
High-temperature capacitive strain measurement system
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Wilson, E. J. |
| Copyright Year | 1975 |
| Description | Capacitive strain gage and signal conditioning system measures stress-induced strain and cancels thermal expansion strain at temperatures to 1,500 F (815 C). Gage does not significantly restrain or reinforce specimen. |
| File Size | 596509 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19750000069 |
| Archival Resource Key | ark:/13960/t9q28pn66 |
| Language | English |
| Publisher Date | 1975-05-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Strain Measurement Strain Gages Thermal Expansion Stress Measurement Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
