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Elastohydrodynamic film thickness model for heavily loaded contacts
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Zaretsky, E. V. Parker, R. J. Loewenthal, S. H. |
| Copyright Year | 1973 |
| Description | An empirical elastohydrodynamic (EHD) film thickness formula for predicting the minimum film thickness occurring within heavily loaded contacts (maximum Hertz stresses above 150,000 psi) was developed. The formula was based upon X-ray film thickness measurements made with synthetic paraffinic, fluorocarbon, Type II ester and polyphenyl ether fluids covering a wide range of test conditions. Comparisons were made between predictions from an isothermal EHD theory and the test data. The deduced relationship was found to adequately reflect the high-load dependence exhibited by the measured data. The effects of contact geometry, material and lubricant properties on the form of the empirical model are also discussed. |
| File Size | 1131127 |
| Page Count | 31 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19730018684 |
| Archival Resource Key | ark:/13960/t2f81471s |
| Language | English |
| Publisher Date | 1973-01-01 |
| Access Restriction | Open |
| Subject Keyword | Machine Elements And Processes Elastohydrodynamics Friction Reduction Numerical Analysis Mathematical Models Lubrication Film Thickness Prediction Analysis Techniques Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
