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Ion masking improves resolution in quadrupole mass spectrometers
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Ierokomos, N. Ruecker, M. R. |
| Copyright Year | 1973 |
| Description | Mass spectrometers analyze molecular composition by determining mass-to-charge ratio of ion fragments of molecules. Study adds significantly to quantitative understanding of quadrupole mass filter. It includes development of quantitative theory of ion oscillations, computer analysis of ion behavior, and identification of determining factors in peak tail size. |
| File Size | 110180 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19730000181 |
| Archival Resource Key | ark:/13960/t4vj09k7w |
| Language | English |
| Publisher Date | 1973-06-01 |
| Access Restriction | Open |
| Subject Keyword | Ion Sources Mass Spectrometers Electric Fields Ionization Quadrupoles Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |