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Indium adhesion provides quantitative measure of surface cleanliness
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1968 |
| Description | Indium tipped probe measures hydrophobic and hydrophilic contaminants on rough and smooth surfaces. The force needed to pull the indium tip, which adheres to a clean surface, away from the surface provides a quantitative measure of cleanliness. |
| File Size | 125375 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19680000342 |
| Archival Resource Key | ark:/13960/t19k93335 |
| Language | English |
| Publisher Date | 1968-09-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |