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Dc pin-to-pin testing of integrated circuits
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1968 |
| Description | External pin-to-pin nondestructive testing procedure measures the electrical characteristics of each element in an integrated circuit. The procedure involves choosing specific pairs of pins and applying appropriate test voltages to them. |
| File Size | 67007 |
| Page Count | 1 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19680000001 |
| Archival Resource Key | ark:/13960/t3906vw6k |
| Language | English |
| Publisher Date | 1968-01-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |