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Circuit measures hysteresis loop areas at 30 hz
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1967 |
| Description | Analog circuit measures hysteresis loop areas as a function of time during fatigue testing of specimens subjected to sinusoidal tension-compression stresses at a frequency of Hz. When the sinusoidal stress signal is multiplied by the strain signal, the dc signal is proportional to hysteresis loop area. |
| File Size | 101622 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19670000518 |
| Archival Resource Key | ark:/13960/t1dk05p72 |
| Language | English |
| Publisher Date | 1967-10-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |