Loading...
Please wait, while we are loading the content...
Test and inspection for process control of monolithic circuits
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1967 |
| Description | Report details the test and inspection procedures for the mass production of high reliability integrated circuits. It covers configuration control, basic fundamentals of quality control, control charts, wafer process evaluation, general process evaluation, evaluation score system, and diffusion evaluation. |
| File Size | 56381 |
| Page Count | 1 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19670000506 |
| Archival Resource Key | ark:/13960/t9h46gc28 |
| Language | English |
| Publisher Date | 1967-12-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |