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Ellipsoidal-mirror reflectometer accurately measures infrared reflectance of materials
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1967 |
| Description | Reflectometer accurately measures the reflectance of specimens in the infrared beyond 2.5 microns and under geometric conditions approximating normal irradiation and hemispherical viewing. It includes an ellipsoidal mirror, a specially coated averaging sphere associated with a detector for minimizing spatial and angular sensitivity, and an incident flux chopper. |
| File Size | 106088 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19670000444 |
| Archival Resource Key | ark:/13960/t53f9h50f |
| Language | English |
| Publisher Date | 1967-11-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |