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Semiconductors can be tested without removing them from circuitry
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1966 |
| Description | Oscilloscope, with specially developed test circuitry, quickly checks semiconductors without removing them from the circuitry. For transistors, approximate gain and linearity, as well as PNP or NPN determinations are made. When testing diodes, open or short circuits, and reverse polarity show up plainly. |
| File Size | 136386 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19660000446 |
| Archival Resource Key | ark:/13960/t3227nh3m |
| Language | English |
| Publisher Date | 1966-11-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
