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Pulse generator permits nondestructive testing of component breakdown voltage
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 1965 |
| Description | Nondestructive testing of the breakdown voltage of transistors and other electronic components is achieved by a simple relay circuit. The circuit operates by applying low-energy, high-voltage microsecond pulses to the components under test. |
| File Size | 60040 |
| Page Count | 1 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19650000054 |
| Archival Resource Key | ark:/13960/t9770722m |
| Language | English |
| Publisher Date | 1965-03-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Components And Circuits Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
