NDLI: Interlaced X-ray diffraction computed tomography

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Interlaced X-ray diffraction computed tomography

Content Provider	Hyper Articles en Ligne (HAL)
Author	Vamvakeros, Antonios Jacques, Simon D. M. Di Michiel, Marco Senecal, Pierre Middelkoop, Vesna Cernik, Robert J. Beale, Andrew M.
Copyright Year	2016
Abstract	An X-ray diffraction computed tomography data-collection strategy that allows, post experiment, a choice between temporal and spatial resolution is reported. This strategy enables time-resolved studies on comparatively short timescales, or alternatively allows for improved spatial resolution if the system under study, or components within it, appear to be unchanging. The application of the method for studying an Mn-Na-W/SiO2 fixed-bed reactor in situ is demonstrated. Additionally, the opportunities to improve the data-collection strategy further, enabling post-collection tuning between statistical, temporal and spatial resolutions, are discussed. In principle, the interlaced scanning approach can also be applied to other pencil-beam tomographic techniques, like X-ray fluorescence computed tomography, X-ray absorption fine structure computed tomography, pair distribution function computed tomography and tomographic scanning transmission X-ray microscopy
Related Links	https://hal.science/hal-01572804/file/J_Applied__Crystallography_49_485.pdf
ISSN	00218898
e-ISSN	16005767
DOI	10.1107/S160057671600131X
Journal	Journal of Applied Crystallography
Volume Number	49
Language	English
Publisher	HAL CCSD International Union of Crystallography
Publisher Date	2016-01-01
Access Restriction	Open
Subject Keyword	X-ray diffraction computed tomography XRD-CT chemical tomography hyperspectral tomography Chemical Sciences
Content Type	Text
Resource Type	Article
Subject	Biochemistry, Genetics and Molecular Biology Chemical Engineering

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