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A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth.
| Content Provider | Europe PMC |
|---|---|
| Author | Li, C. Jacques, S. D. M. Chen, Y. Daisenberger, D. Xiao, P. Markocsan, N. Nylen, P. Cernik, R. J. |
| Copyright Year | 2016 |
| Related Links | https://europepmc.org/backend/ptpmcrender.fcgi?accid=PMC5139989&blobtype=pdf |
| ISSN | 00218898 |
| Journal | Journal of Applied Crystallography [J Appl Crystallogr] |
| Volume Number | 49 |
| PubMed Central reference number | PMC5139989 |
| Issue Number | Pt 6 |
| Issue Number | pt 6 |
| PubMed reference number | 27980507 |
| e-ISSN | 16005767 |
| DOI | 10.1107/s1600576716013935 |
| Language | English |
| Publisher | International Union of Crystallography |
| Publisher Date | 2016-10-21 |
| Access Restriction | Open |
| Rights License | This is an open-access article distributed underthe terms of the Creative Commons AttributionLicence, which permits unrestricted use,distribution, and reproduction in any medium,provided the original authors and source arecited. © C. Li et al. 2016 |
| Subject Keyword | thermal barrier coatings synchrotron glancing-angle X-ray diffraction stress mapping flat plate powder diffraction |
| Content Type | Text |
| Resource Type | Article |
| Subject | Biochemistry, Genetics and Molecular Biology |