Probe-Position Error Correction in Planar Near Field Measurements at 60 GHz: Experimental Verification.

Content Provider	Europe PMC
Author	Muth, Lorant A.
Copyright Year	1992
Abstract	This study was conducted to verify that the probe-position error correction can be successfully applied to real data obtained on a planar near-field range where probe position errors are known. Since probe position-error correction is most important at high frequencies, measurements were made at 60 GHz. Six planar scans at z positions separated by 0.03 A were obtained. The correction technique was applied to an error-contaminated near field constructed out of the six scans according to a discretized periodic error function. The results indicate that probe position errors can be removed from real near-field data as successfully as from simulated data; some residual errors, which are thought to be due to multiple reflections, residual drift in the measurement system, and residual probe position errors in all three coordinates, are observed.
ISSN	1044677X
Journal	Journal of Research of the National Institute of Standards and Technology
Volume Number	97
PubMed Central reference number	PMC4914235
Issue Number	2
PubMed reference number	28053433
e-ISSN	21657254
DOI	10.6028/jres.097.009
Language	English
Publisher	[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
Publisher Date	1992-03-01
Access Restriction	Open
Rights License	The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
Subject Keyword	error correction experimental verification planar near fields probe-position errors
Content Type	Text
Resource Type	Article
Subject	Engineering