Unusual surface and edge morphologies, sp2 to sp3 hybridized transformation and electronic damage after Ar+ ion irradiation of few-layer graphene surfaces

Content Provider	CUSAT-Thesis
Author	Anantharaman, M. R. Al-harthi, S. H. Mohammed, Elzain Muataz, Al-barwani Amal, Kora'a Thomas, Hysen Myo, Tay Zar Myint
Abstract	Roughness and defects induced on few-layer graphene (FLG) irradiated by Ar+ ions at different energies wereinvestigated using X-ray photoemission spectroscopy (XPS) and atomic force microscopy techniques. The resultsprovide direct experimental evidence of ripple formation, sp2 to sp3 hybridized carbon transformation, electronicdamage, Ar+ implantation, unusual defects and edge reconstructions in FLG, which depend on the irradiationenergy. In addition, shadowing effects similar to those found in oblique-angle growth of thin films were seen.Reliable quantification of the transition from the sp2-bonding to sp3-hybridized state as a result of Ar+ ion irradiationis achieved from the deconvolution of the XPS C (1s) peak. Although the ion irradiation effect is demonstratedthrough the shape of the derivative of the Auger transition C KVV spectra, we show that the D parameter valuesobtained from these spectra which are normally used in the literature fail to account for the sp2 to sp3 hybridizationtransition. In contrast to what is known, it is revealed that using ion irradiation at large FLG sample tilt angles canlead to edge reconstructions. Furthermore, FLG irradiation by low energy of 0.25 keV can be a plausible way ofpeeling graphene layers without the need of Joule heating reported previously
File Format	PDF
Language	English
Publisher	Springer
Access Restriction	Open
Subject Keyword	Few layer graphene Argon sputtering Electronic damage Edge reconstructions
Content Type	Text
Resource Type	Article