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Photothermal beam deflection for non-destructive evaluation of semiconductor thin films
| Content Provider | CUSAT-Thesis |
|---|---|
| Advisor | Dr.Vijayakumar, K P |
| Researcher | Anita, Warrier R |
| Abstract | Non-destructive testing (NDT) is the use of non-invasive techniques to determine theintegrity of a material, component, or structure. Engineers and scientists use NDT in avariety of applications, including medical imaging, materials analysis, and process control.Photothermal beam deflection technique is one of the most promising NDT technologies.Tremendous R&D effort has been made for improving the efficiency and simplicity of thistechnique. It is a popular technique because it can probe surfaces irrespective of the size ofthe sample and its surroundings. This technique has been used to characterize severalsemiconductor materials, because of its non-destructive and non-contact evaluationstrategy. Its application further extends to analysis of wide variety of materials. Instrumentation of a NDT technique is very crucial for any material analysis. Chapter twoexplores the various excitation sources, source modulation techniques, detection and signalprocessing schemes currently practised. The features of the experimental arrangementincluding the steps for alignment, automation, data acquisition and data analysis areexplained giving due importance to details.Theoretical studies form the backbone of photothermal techniques. The outcome of atheoretical work is the foundation of an application.The reliability of thetheoretical model developed and used is proven from the studies done on crystalline.The technique is applied for analysis of transport properties such as thermal diffusivity,mobility, surface recombination velocity and minority carrier life time of the material andthermal imaging of solar cell absorber layer materials like CuInS2, CuInSe2 and SnS thinfilms.analysis of In2S3 thin films, which are used as buffer layer material insolar cells. The various influences of film composition, chlorine and silver incorporation inthis material is brought out from the measurement of transport properties and analysis ofsub band gap levels.The application of photothermal deflection technique for characterization of solar cells is arelatively new area that requires considerable attention.The application of photothermal deflection technique for characterization of solar cells is arelatively new area that requires considerable attention. Chapter six thus elucidates thetheoretical aspects of application of photothermal techniques for solar cell analysis. Theexperimental design and method for determination of solar cell efficiency, optimum loadresistance and series resistance with results from the analysis of CuInS2/In2S3 based solarcell forms the skeleton of this chapter. |
| File Format | |
| Language | English |
| Publisher Institution | Cochin University of Science & Technology |
| Access Restriction | Open |
| Subject Keyword | Photothermal beam deflection non-destructive evaluation semiconductor thin films Instrumentation absorber layer materials buffer layer material |
| Content Type | Text |
| Educational Degree | Doctor of Philosophy (Ph.D.) |
| Resource Type | Thesis |
