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RL-Huffman encoding for test compression and power reduction in scan application (2005)
| Content Provider | CiteSeerX |
|---|---|
| Author | Nourani, Mehrdad Tehranipour, Mohammad H. |
| Abstract | This article mixes two encoding techniques to reduce test data volume, test pattern delivery time, and power dissipation in scan test applications. This is achieved by using run-length encoding followed by Huffman encoding. This combination is especially effective when the percentage of don’t cares in a test set is high, which is a common case in today’s large systems-on-chips (SoCs). Our analysis and experimental results confirm that achieving up to an 89 % compression ratio and a 93 % scan-in power reduction is possible for scan-testable circuits such as ISCAS89 benchmarks. |
| File Format | |
| Volume Number | 10 |
| Journal | ACM Trans. Design Automat. Electron. Syst |
| Language | English |
| Publisher Date | 2005-01-01 |
| Access Restriction | Open |
| Subject Keyword | Test Compression Power Reduction Scan Application Rl-huffman Encoding Run-length Encoding Scan-testable Circuit Common Case Scan-in Power Reduction Large Systems-on-chips Power Dissipation Iscas89 Benchmark Compression Ratio Test Data Volume Test Set Scan Test Application Experimental Result Test Pattern Delivery Time |
| Content Type | Text |
| Resource Type | Article |
