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Pre-silicon verification of the alpha 21364 microprocessor error handling system.
| Content Provider | CiteSeerX |
|---|---|
| Author | Lee, Richard Tsien, Benjamin |
| Abstract | This paper presents the strategy used to verify the error logic in the Alpha 21364 microprocessor. Traditional pre-silicon strategies of focused testing or unit-level random testing yield limited results in finding complex bugs in the error handling logic of a microprocessor. This paper introduces a technique to simulate error conditions and their recovery in a global environment using random test stimulus closely approximating traffic found in a real system. A significant number of bugs were found using this technique. A majority of these bugs could not be uncovered using a simple random environment, or were counter-intuitive to focused test design. 1. |
| File Format | |
| Access Restriction | Open |
| Subject Keyword | Microprocessor Error Handling System Pre-silicon Verification Significant Number Simple Random Environment Traditional Pre-silicon Strategy Complex Bug Global Environment Unit-level Random Focused Test Design Random Test Stimulus Yield Limited Result Error Condition Real System Error Logic Focused Testing |
| Content Type | Text |
| Resource Type | Article |
