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Improvement of the Fault Coverage of the Pseudo-Random Phase in Column Matching BIST (2005)
| Content Provider | CiteSeerX |
|---|---|
| Author | Fiser, Petr Kubatova, Hana |
| Description | Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of faults should be detected by the pseudo-random phase, to reduce the number of faults to be covered in the deterministic one. We study the properties of different pseudo-random pattern generators. Their successfulness in fault covering strictly depends on the tested circuit. We examine properties of LFSRs and cellular automata. Four methods enhancing the pseudo-random fault coverage have been proposed. Then we propose a universal method to efficiently compute test weights. |
| File Format | |
| Language | English |
| Publisher Date | 2005-01-01 |
| Publisher Institution | IN COLUMN MATCHING BIST, PROC. 31TH EUROMICRO SYMPOSIUM ON DIGITAL SYSTEMS DESIGN (DSD'05) |
| Access Restriction | Open |
| Subject Keyword | Column Matching Bist Cellular Automaton Different Pseudo-random Pattern Generator Pseudo-random Phase Fault Coverage Universal Method Test Weight Several Method Deterministic One Mixed-mode Bist Pseudo-random Fault Coverage |
| Content Type | Text |
| Resource Type | Article |
