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Intrabeam scattering analysis of atf beam measurements (2001).
| Content Provider | CiteSeerX |
|---|---|
| Author | Bane, K. L. F. Hayano, H. Kubo, K. Naito, T. Okugi, T. Urakawa, J. |
| Abstract | At the Accelerator Test Facility (ATF) at KEK intrabeam scattering (IBS) is a strong effect for an electron machine. It is an effect that couples all dimensions of the beam, and in April 2000, over a short period of time, all dimensions were measured as functions of current. In this report we derive a simple relation for the growth rates of emittances due to IBS. We apply the theories of Bjorken-Mtingwa, Piwinski, and a formula due to Raubenheimer to the ATF parameters, and find that the results all agree (if in Piwinski’s formalism we replace 2 = by H). Finally, we compare theory, including the effect of potential well bunch lengthening, with the April 2000 measurements, and find reasonably good agreement in the energy spread and horizontal emittance dependence on current. The vertical emittance measurement, however, implies that either: there is error in the measurement (equivalent to an introduction of 0.6 % x-y coupling error), or the effect of intrabeam scattering is stronger than predicted (35 % stronger in growth rates). |
| File Format | |
| Publisher Date | 2001-01-01 |
| Access Restriction | Open |
| Subject Keyword | Atf Beam Measurement Intrabeam Scattering Analysis Growth Rate Piwinski Formalism Strong Effect Potential Well Bunch Lengthening Energy Spread Intrabeam Scattering Short Period Kek Intrabeam Scattering Simple Relation Horizontal Emittance Dependence Good Agreement Electron Machine Vertical Emittance Measurement Accelerator Test Facility Atf Parameter |
| Content Type | Text |
