NDLI: Scanning probe microscopy studies of carbon nanotubes.

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Scanning probe microscopy studies of carbon nanotubes.

Content Provider	CiteSeerX
Author	Odom, Teri Wang Hafner, Jason H. Lieber, Charles M.
Abstract	Abstract. This paper summarizes scanning probe microscopy investigations of the properties and manipulation of carbon nanotubes, and moreover, the fabrica-tion and utilization of nanotubes as novel tips for probe microscopy experiments. First, scanning tunneling microscopy and spectroscopy measurements that eluci-date (1) the basic relationship between Single-Walled Carbon Nanotube (SWNT) atomic structure and electronic properties, (2) the one-dimensional band structure of nanotubes, (3) localized structures in SWNTs, and (4) the electronic behavior of finite-size SWNTs are discussed. Second, atomic force microscopy investigations of the manipulation of nanotubes on surfaces to obtain information about nanotube-surface interactions and nanotube mechanical properties, and to create nanotube device structures are reviewed. Lastly, the fabrication, properties and application of carbon nanotube probe microscopy tips to ultrahigh resolution and chemically sensitive imaging are summarized. Prospects for future research are discussed. Carbon nanotubes are currently the focus of intense interest worldwide. This attention to carbon nanotubes is not surprising in light of their promise
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Subject Keyword	Carbon Nanotube Probe Microscopy Study Nanotube Device Structure Electronic Property Ultrahigh Resolution Electronic Behavior One-dimensional Band Structure Intense Interest Worldwide Novel Tip Atomic Force Microscopy Investigation Single-walled Carbon Nanotube Basic Relationship Nanotube Mechanical Property Carbon Nanotube Probe Microscopy Tip Sensitive Imaging Nanotube-surface Interaction Spectroscopy Measurement Finite-size Swnts Atomic Structure Probe Microscopy Investigation Future Research Probe Microscopy Experiment
Content Type	Text
Resource Type	Article

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