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Defect Detection in Textile Fabric Images Using Wavelet Transforms and
| Content Provider | CiteSeerX |
|---|---|
| Author | Ertuzun, A. Serdaroglu, A. Ercil, A. |
| Description | St. Petersburg, Russian Federation |
| Abstract | In this paper, a new method based on the use of wavelet transformation prior to independent component analysis for solving the problem of defect detection in textile fabric images is presented. Different sub-bands of the wavelet packet tree scheme of the defect-free sub-windows are obtained and independent components of these subbands are calculated as the basis vectors. The true feature vectors corresponding to these basis vectors are computed. The test sub-window is labeled as defective or not according to the Euclidean distance between the true feature vector representing the non-defective regions and the feature vector of the sub-window under test. The advantage of adding wavelet analysis prior to independent component analysis is presented. 1. |
| File Format | |
| Access Restriction | Open |
| Subject Keyword | Different Sub-bands Feature Vector Defect-free Sub-windows Independent Component Analysis Euclidean Distance Defect Detection Non-defective Region Wavelet Packet Tree Scheme Basis Vector Independent Component Wavelet Analysis Test Sub-window True Feature Vector Textile Fabric Image Wavelet Transformation |
| Content Type | Text |
