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Electronic speckle pattern interferometry (2006).
| Content Provider | CiteSeerX |
|---|---|
| Author | Mujeeb, A. Ravindran, V. R. Nayar, V. U. |
| Abstract | Electronic Speckle Pattern Interferometry (ESPI) is a highly sensitive optoelectronic whole field technique used for measuring surface displacement strain analysis, surface roughness, surface contour etc. This nondestructive evaluation technique permits measurement of deformations in the micrometer and sub micrometer ranges produced in a test specimen under different loading conditions. In ESPI technique, the speckle patterns act as information carriers of different deformation states of the test specimen. These speckle patterns of the object before and after loading are electronically detected and digitally processed to generate interference fringes. In this paper a method for real time and continuous acquisition of ESPI images and the simultaneous electronic processing is discussed. |
| File Format | |
| Publisher Date | 2006-01-01 |
| Access Restriction | Open |
| Subject Keyword | Electronic Speckle Pattern Interferometry Test Specimen Sensitive Optoelectronic Whole Field Technique Contour Etc Simultaneous Electronic Processing Nondestructive Evaluation Technique Speckle Pattern Surface Roughness Espi Image Information Carrier Different Loading Condition Espi Technique Continuous Acquisition Sub Micrometer Different Deformation State Surface Displacement Strain Analysis Interference Fringe Real Time |
| Content Type | Text |
| Resource Type | Article |
