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Vlsi testing (spring 2004) 1 subscripted d-algorithm.
| Content Provider | CiteSeerX |
|---|---|
| Author | Doshi, Alok |
| Abstract | Abstract-- The main idea behind subscripted D-Algorithm is to reduce the test vector set and to increase the speed of test generation. To achieve this, the algorithm uses the technique of sensitizing multiple paths at the same time. It constructs a single test pattern to simultaneously test as many faults as possible. The time required to generate this test pattern is normally the same as the time that the D-Algorithm takes to find a single test. So the overall performance of the subscripted D–Algorithm is found to be much better compared to Roth’s D–Algorithm. I. |
| File Format | |
| Access Restriction | Open |
| Content Type | Text |
