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Random and systematic defect analysis using iddq signature analysis for understanding fails and guiding test decisions.
| Content Provider | CiteSeerX |
|---|---|
| Author | Gattiker, Anne Nigh, Phil |
| Abstract | This paper demonstrates IDDQ signature analysis of random and systematic defects, including yield detractors and reliability defects. Application is demonstrated for both understanding failure root cause and guiding test decisions. |
| File Format | |
| Access Restriction | Open |
| Subject Keyword | Understanding Fails Test Decision Reliability Defect Understanding Failure Root Cause Guiding Test Decision Systematic Defect Iddq Signature Analysis Yield Detractor |
| Content Type | Text |
| Resource Type | Article |
