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Progress in disease resistance and yield potential: an analysis of VEF - EP Nurseries (1979 - 1986)
| Content Provider | Consultative Group on International Agricultural Research (CGIAR) |
|---|---|
| Author | Amézquita, María Cristina Voysest Voysest, Oswaldo |
| Spatial Coverage | Colombia [CO] |
| Description | Using the data generated by VEF (vivero equipo de frijol) and EP (ensayo preliminar de rendimiento) nurseries during 1979-86, the progress of the CIAT Bean Program during this 8-yr period of plant breeding effort is described in terms of the production of disease resistant lines and the attainment of high-yield-potential lines with disease resistance attributes. The analysis of disease reaction evaluations of VEF-EP nurseries shows an increasing trend in the production of bean lines resistant to the 5 diseases considered (rust, anthracnose, angular leaf spot, common bacterial blight, and BCMV). There are enough sources of combined disease resistance to satisfy specific regional needs. Twenty-five percent of the 1257 lines tested at EP nurseries in the 3- yr period between 1984 and 1986 are high yield potential lines. (CIAT) |
| Related Links | https://cgspace.cgiar.org/items/eed0f77b-78ba-4fe1-ad0b-5f9b0f577abd |
| File Format | |
| Language | English |
| Publisher | International Center for Tropical Agriculture |
| Publisher Date | 1987-01-01 |
| Access Restriction | Open |
| Subject Keyword | Phaseolus Vulgaris Cultivars Adaptation Resistance Uromyces Phaseoli Colletotrichum Lindemuthianum Isariopsis Griseola Xanthomonas Campestris Phaseoli Bean Common Mosaic Virus Statistical Analysis Bacterial Diseases Diseases and Pathogens Mycoses Pests Viroses Variedades Adaptación Resistencia Virus Del Mosaico Común Frijol Analisis Estadistico Beans |
| Content Type | Text |
| Resource Type | Article |
| Subject | Agronomy and Crop Science Food Science Plant Science |