NDLI: Using managed runtime systems to tolerate holes in wearable memories

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Using managed runtime systems to tolerate holes in wearable memories

Content Provider	ACM Digital Library
Author	Strauss, Karin McKinley, Kathryn S. Gao, Tiejun Burger, Doug Larus, James Blackburn, Stephen M.
Abstract	New memory technologies, such as phase-change memory (PCM), promise denser and cheaper main memory, and are expected to displace DRAM. However, many of them experience permanent failures far more quickly than DRAM. DRAM mechanisms that handle permanent failures rely on very low failure rates and, if directly applied to PCM, are extremely inefficient: Discarding a page when the first line fails wastes 98% of the memory. This paper proposes low complexity cooperative software and hardware that handle failure rates as high as 50%. Our approach makes error handling transparent to the application by using the memory abstraction offered by managed languages. Once hardware error correction for a memory line is exhausted, rather than discarding the entire page, the hardware communicates the failed line to a failure-aware OS and runtime. The runtime ensures memory allocations never use failed lines and moves data when lines fail during program execution. This paper describes minimal extensions to an Immix mark-region garbage collector, which correctly utilizes pages with failed physical lines by skipping over failures. This paper also proposes hardware support that clusters failed lines at one end of a memory region to reduce fragmentation and improve performance under failures. Contrary to accepted hardware wisdom that advocates for wear-leveling, we show that with software support non-uniform failures delay the impact of memory failure. Together, these mechanisms incur no performance overhead when there are no failures and at failure levels of 10% to 50% suffer only an average overhead of 4% and 12%}, respectively. These results indicate that hardware and software cooperation can greatly extend the life of wearable memories.
Starting Page	297
Ending Page	308
Page Count	12
File Format	PDF
ISBN	9781450320146
DOI	10.1145/2491956.2462171
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2013-06-16
Publisher Place	New York
Access Restriction	Subscribed
Subject Keyword	Memory management Phase-change memory Failure tolerance
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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